DIAVITE NANO VH roughness measuring device for skidded tracers

Application

For standardised roughness measurement in production and measuring rooms. Depending on the application, the NANO feed unit with integrated interface can be connected to an MS Windows PC or tablet. Evaluation, storage and documentation carried out via the DIAVITE App Light software.

Execution

• Roughness parameters in accordance with DIN ISO, JIS, ASME
• including SH standard probe with diamond probe tip 5 µm
• Calibration of up to 8 probes
• A range of optional measuring probes are available, for almost all measuring tasks, customer-specific solutions possible
• with VH external feed unit for skidded tracers

Advantage

• selectable standardised evaluation of parameters in accordance with ISO standard 4287 (withdrawn) and new ISO standard 21920-2:2021
• simple and intuitive operation, no training required
• Measurements in all directions: horizontal, vertical and overhead
• Measurement programs optionally accessible via barcode scanner. Image of the measuring task can be stored in the measurement program.
• Storage of measurement conditions in measurement program and creation of test record in pdf, csv and txt format